This exam enables you to demonstrate the knowledge required for using Synopsys TestMAX™ ATPG to generate test patterns for stuck-at faults given a scan gate-level design created by TestMAX DFT or other tools, describe the test protocol and test pattern timing using STIL, debug DRC and stuck-at fault coverage problems using the Graphical Schematic Viewer, troubleshoot fault coverage problems, save and validate test patterns, troubleshoot simulation failures.

• Type Certification
• Level Foundational